Device parameter extraction in the linear region of MOSFET's

IEEE Electron Device Letters

Volumn 18, Issue 9, 1997, Pages 408-410

  Katto, H ^a,b  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b IEEE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; CURVE FITTING; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK PARAMETERS; ELECTRIC RESISTANCE; LEAST SQUARES APPROXIMATIONS;

PARAMETER EXTRACTION METHODS; TAUR'S METHOD;

MOSFET DEVICES;

EID: 0031233839     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.622512     Document Type: Article

References (7)

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