Measurement of threshold voltage and channel length of submicron MOSFETs

IEE Proceedings I: Solid State and Electron Devices

Volumn 135, Issue 6, 1988, Pages 162-164

  Jain, S ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS--VOLTAGE; TRANSISTORS--MEASUREMENTS;

CHANNEL LENGTH; DRAIN SERIES RESISTANCE; EXTRACTED TRANSISTOR PARAMETERS; LDD TRANSISTORS; SUBMICRON MOSFETS; THRESHOLD VOLTAGE;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0024143472     PISSN: 01437100     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-i-1.1988.0029     Document Type: Article

References (7)