The future of wires

Proceedings of the IEEE

Volumn 89, Issue 4, 2001, Pages 490-504

  Ron, H O ^a   Mai, Kenneth W ^a   Fellow, A ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

Capacitance; Delay estimation; Electromagnetic coupling; Inductance; Interconnections; Resistance; Technology forecasting; Wire

Indexed keywords

EID: 33646922057     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/5.920580     Document Type: Article

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