IC analyses including extracted inductance models

Proceedings - Design Automation Conference

Volumn , Issue , 1999, Pages 915-920

  Beattie, Michael W ^a   Pileggi, Lawrence T ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; INTEGRATED CIRCUIT LAYOUT; INTERCONNECTION NETWORKS;

EXTRACTED INDUCTANCE MODELS;

INTEGRATED CIRCUIT TESTING;

EID: 0032629526     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/309847.310098     Document Type: Conference Paper

References (15)