Model of tip-sample interaction and image reconstruction

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 2, 2006, Pages 507-513

  Du, Sidan ^a   Cai, Lian ^a   Li, Yang ^a   Gao, Duntang ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Blind reconstruction; Electric force; In situ scanning tunneling microscope (STM); Scanning probe microscopy (SPM); Tip geometry

Indexed keywords

CALCULATIONS; GEOMETRY; IMAGE ENHANCEMENT; IMAGE RECONSTRUCTION; SCANNING TUNNELING MICROSCOPY; TECHNOLOGY;

BLIND RECONSTRUCTION; ELECTRIC FORCE; SCANNING PROBE MICROSCOPY; TIP GEOMETRY;

IMAGE QUALITY;

EID: 33645349041     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2006.870314     Document Type: Article

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