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Volumn 237-239, Issue 1-4 I, 2002, Pages 254-258
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In-situ observation of Pd2Si islands on Si by UHV-TEM/STM
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Author keywords
A1. Scanning tunneling microscopy; A1. Transmission electron microscopy; A2. Island growth; B1. Silicide
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Indexed keywords
ANNEALING;
COMPUTER SIMULATION;
DEPOSITION;
PALLADIUM COMPOUNDS;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SILICON;
SURFACE TOPOGRAPHY;
TRANSMISSION ELECTRON MICROSCOPY;
SURFACE RECONSTRUCTION;
CRYSTAL GROWTH;
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EID: 17344375767
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)01878-4 Document Type: Conference Paper |
Times cited : (6)
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References (15)
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