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Surface Science
Volumn 491, Issue 3, 2001, Pages 473-483
A method to improve the quantitative analysis of SFM images at the nanoscale
(2)
Todd, Brian A
a
Eppell, Steven J
a
a
Case Western Reserve University
(
United States
)
Author keywords
Atomic force microscopy; Biological molecules proteins; Surface structure, morphology, roughness, and topography
Indexed keywords
ATOMIC FORCE MICROSCOPY; BIOMATERIALS; IMAGE RECONSTRUCTION; MATHEMATICAL MORPHOLOGY; SURFACE TOPOGRAPHY;
SCANNED FORCE MICROSCOPY (SFM);
PROTEINS;
EID
:
0035501372
PISSN
:
00396028
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1016/S0039-6028(01)01313-9
Document Type
:
Article
Times cited : (
34
)
References (
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.
