Electric force microscopy study of the surface electrostatic property of rubbed polyimide alignment layers

Thin Solid Films

Volumn 370, Issue 1, 2000, Pages 238-242

  Liang, Xiao ^a   Liu, Jia ^a   Han, Li ^a   Tang, Hong ^a   Xu, Shou Yi ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ELECTROSTATICS; LIQUID CRYSTALS; MICROSCOPIC EXAMINATION; MOLECULAR ORIENTATION; SURFACE PROPERTIES; SYNTHESIS (CHEMICAL); VAN DER WAALS FORCES; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTAL ROTATION METHOD; CYANO PENTYLBIPHENYL; ELECTRIC FORCE MICROSCOPY; RUBBING; SURFACE ELECTROSTATIC PROPERTY;

POLYIMIDES;

EID: 0033723409     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00937-8     Document Type: Article

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