-
1
-
-
0004001123
-
-
Sandia National Laboratories, Sandia Rep. SAND2000-0091
-
D. M. Tanner et al., "MEMS Reliability: Infrastructure, Test Structures, Experiments, and Failure Modes," Sandia National Laboratories, Sandia Rep. SAND2000-0091, 2000.
-
(2000)
"MEMS Reliability: Infrastructure, Test Structures, Experiments, and Failure Modes"
-
-
Tanner, D.M.1
-
2
-
-
0034270152
-
"Electronically probed measurements of MEMS geometries"
-
R. K. Gupta, "Electronically probed measurements of MEMS geometries," J. Microelectromech. Syst., vol. 9, pp. 380-389, 2000.
-
(2000)
J. Microelectromech. Syst.
, vol.9
, pp. 380-389
-
-
Gupta, R.K.1
-
3
-
-
0036967116
-
"Using compliant mechanisms to improve manufacturability in MEMS"
-
DETC2002/DFM-34178
-
D. C. Kemeny, L. L. Howell, and S. P. Magleby, "Using compliant mechanisms to improve manufacturability in MEMS," in Proc. 2002 ASME DETC, 2002, DETC2002/DFM-34178.
-
(2002)
Proc. 2002 ASME DETC
-
-
Kemeny, D.C.1
Howell, L.L.2
Magleby, S.P.3
-
4
-
-
0002732943
-
"A methodical approach to the design of compliant micromechanisms"
-
Hilton Head Island, SC
-
G. K. Ananthasuresh, S. Kota, and Y. Gianchandani, "A methodical approach to the design of compliant micromechanisms," in Proc. IEEE Solid-State Sensor and Actuator Workshop, Hilton Head Island, SC, 1994, pp. 189-192.
-
(1994)
Proc. IEEE Solid-State Sensor and Actuator Workshop
, pp. 189-192
-
-
Ananthasuresh, G.K.1
Kota, S.2
Gianchandani, Y.3
-
5
-
-
78249276900
-
"Predicting the performance of a bistable micro mechanism using design-stage uncertainty analysis"
-
New, Orleans, LA, Nov. 17-22, IMECE2002-33262
-
J. W. Wittwer, L. L. Howell, S. M. Wait, and M. S. Cherry, "Predicting the performance of a bistable micro mechanism using design-stage uncertainty analysis," in Proc. ASME IMECE 2002, New Orleans, LA, Nov. 17-22, 2002, IMECE2002-33262.
-
(2002)
Proc. ASME IMECE 2002
-
-
Wittwer, J.W.1
Howell, L.L.2
Wait, S.M.3
Cherry, M.S.4
-
6
-
-
6444244390
-
"Parametric yield optimization of MEMS"
-
F. Delauche, B. Affour, and C. Dufaza, "Parametric yield optimization of MEMS," in Proc. SPIE, vol. 4755, 2002, pp. 126-135.
-
(2002)
Proc. SPIE
, vol.4755
, pp. 126-135
-
-
Delauche, F.1
Affour, B.2
Dufaza, C.3
-
7
-
-
6444245912
-
"Influence of process variation on the functionality of a high pressure sensor"
-
J. Muchow, A. Kretschmann, R. Henn, K. Skrobanek, S. Finkbeiner, and H. R. Krauss, "Influence of process variation on the functionality of a high pressure sensor," in Proc. SPIE, vol. 4755, 2002, pp. 143-148.
-
(2002)
Proc. SPIE
, vol.4755
, pp. 143-148
-
-
Muchow, J.1
Kretschmann, A.2
Henn, R.3
Skrobanek, K.4
Finkbeiner, S.5
Krauss, H.R.6
-
8
-
-
0035506636
-
"Robust optimal design of a vibratory microgyroscope considering fabrication errors"
-
J. S. Han and B. M. Kwak, "Robust optimal design of a vibratory microgyroscope considering fabrication errors," J. Micromech. Microeng., vol. 11, no. 6, pp. 662-671, 2001.
-
(2001)
J. Micromech. Microeng.
, vol.11
, Issue.6
, pp. 662-671
-
-
Han, J.S.1
Kwak, B.M.2
-
13
-
-
0027558797
-
"A general approach for robust optimal design"
-
A. R. Parkinson, C. Sorensen, and N. Pourhassan, "A general approach for robust optimal design," J. Mech. Des.: Trans. ASME, vol. 115, no. 1, pp. 74-80, 1993.
-
(1993)
J. Mech. Des.: Trans. ASME
, vol.115
, Issue.1
, pp. 74-80
-
-
Parkinson, A.R.1
Sorensen, C.2
Pourhassan, N.3
-
15
-
-
0036155594
-
"Surface micromachined force gauges: Uncertainty and reliability"
-
J. W. Wittwer, T. Gomm, and L. L. Howell, "Surface micromachined force gauges: Uncertainty and reliability," J. Micromech. Microeng., vol. 12, pp. 13-20, 2002.
-
(2002)
J. Micromech. Microeng.
, vol.12
, pp. 13-20
-
-
Wittwer, J.W.1
Gomm, T.2
Howell, L.L.3
-
16
-
-
0005059180
-
"A linear displacement bistable micromechanism"
-
DETC2000/MECH-14 117
-
M. S. Baker, S. M. Lyon, and L. L. Howell, "A linear displacement bistable micromechanism," in Proc. 2000 ASME DETC, 2000, DETC2000/ MECH-14 117, pp. 1-7.
-
(2000)
Proc. 2000 ASME DETC
, pp. 1-7
-
-
Baker, M.S.1
Lyon, S.M.2
Howell, L.L.3
-
17
-
-
0036450141
-
"Design by analysis of a MEMS pressure sensor"
-
R. J. Pryputniewicz, C. Furlong, and E. J. Pryputniewicz, "Design by analysis of a MEMS pressure sensor," in Proc. SPIE, vol. 4931, 2002, pp. 81-86.
-
(2002)
Proc. SPIE
, vol.4931
, pp. 81-86
-
-
Pryputniewicz, R.J.1
Furlong, C.2
Pryputniewicz, E.J.3
-
18
-
-
0035439352
-
"Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS"
-
B. D. Jensen, M. P. de Boer, N. D. Masters, F. Bitsie, and D. A. LaVan, "Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS," J. Microelectromech. Syst., vol. 10, pp. 336-346, 2001.
-
(2001)
J. Microelectromech. Syst.
, vol.10
, pp. 336-346
-
-
Jensen, B.D.1
de Boer, M.P.2
Masters, N.D.3
Bitsie, F.4
LaVan, D.A.5
-
19
-
-
0035557593
-
"Resonating microelectromechanical structures for metrology"
-
A. M. Allen and G. C. Johnson, "Resonating microelectromechanical structures for metrology," in Mater. Res. Soc. Symp. Proc., vol. 657, 2001, pp. EE141-EE146.
-
(2001)
Mater. Res. Soc. Symp. Proc.
, vol.657
-
-
Allen, A.M.1
Johnson, G.C.2
-
20
-
-
0033338450
-
"Materials characterization forMEMS - A comparison of uniaxial and bending tests"
-
G. C. Johnson, P. T. Jones, and R. T. Howe, "Materials characterization forMEMS - A comparison of uniaxial and bending tests," in Proc. SPIE, vol. 3874, 1999, pp. 94-101.
-
(1999)
Proc. SPIE
, vol.3874
, pp. 94-101
-
-
Johnson, G.C.1
Jones, P.T.2
Howe, R.T.3
-
22
-
-
0027710776
-
"Probabilistic response of micro-fabricated polysilicon beam structures: Comparison of analysis and experiments"
-
D. Mirfendereski, L. Lin, A. D. Kiureghian, and A. P. Pisano, "Probabilistic response of micro-fabricated polysilicon beam structures: Comparison of analysis and experiments," ASME, Dynamic Systems and Control Division, vol. 46, pp. 77-80, 1993.
-
(1993)
ASME, Dynamic, Systems and Control Division
, vol.46
, pp. 77-80
-
-
Mirfendereski, D.1
Lin, L.2
Kiureghian, A.D.3
Pisano, A.P.4
-
23
-
-
0034989831
-
"Process variation analysis for MEMS design"
-
L. Schenato, W.-C. Wu, L. E. Ghaoui, and K. Pister, "Process variation analysis for MEMS design," in Proc. SPIE, vol. 4236, 2001, pp. 272-279.
-
(2001)
Proc. SPIE
, vol.4236
, pp. 272-279
-
-
Schenato, L.1
Wu, W.-C.2
Ghaoui, L.E.3
Pister, K.4
-
24
-
-
6444244446
-
"Tolerance analysis and synthesis in micro systems"
-
C. Germer, H.-J. Hansen, S. Franke, and S. Buttgenbach, "Tolerance analysis and synthesis in micro systems," in Proc. SPIE, vol. 4755, 2002, pp. 355-364.
-
(2002)
Proc. SPIE
, vol.4755
, pp. 355-364
-
-
Germer, C.1
Hansen, H.-J.2
Franke, S.3
Buttgenbach, S.4
-
25
-
-
0036773371
-
"MEMS resonators that are robust to process-induced feature width variations"
-
R. Liu, B. Paden, and K. Turner, "MEMS resonators that are robust to process-induced feature width variations," J. Microelectromech. Syst., vol. 11, pp. 505-51, 2002.
-
(2002)
J. Microelectromech. Syst.
, vol.11
, pp. 505-551
-
-
Liu, R.1
Paden, B.2
Turner, K.3
-
26
-
-
14044258616
-
"Design of microresonators under uncertainty"
-
A. Mawardi and R. Pitchumani, "Design of microresonators under uncertainty," J. Microelectromech. Syst., vol. 14, pp. 63-69, 2005.
-
(2005)
J. Microelectromech. Syst.
, vol.14
, pp. 63-69
-
-
Mawardi, A.1
Pitchumani, R.2
-
27
-
-
0037402083
-
"Reliability-based design of MEMS mechanisms by topology optimization"
-
K. Maute and D. M. Frangopol, "Reliability-based design of MEMS mechanisms by topology optimization," Comput. Structures, vol. 81, pp. 813-824, 2003.
-
(2003)
Comput. Structures
, vol.81
, pp. 813-824
-
-
Maute, K.1
Frangopol, D.M.2
-
28
-
-
0036572996
-
"In-plane linear-displacement bistable microrelay"
-
T. Gomm, L. L. Howell, and R. H. Selfridge, "In-plane linear-displacement bistable microrelay," J. Micromech. Microeng., vol. 12, no. 3, pp. 257-264, 2002.
-
(2002)
J. Micromech. Microeng.
, vol.12
, Issue.3
, pp. 257-264
-
-
Gomm, T.1
Howell, L.L.2
Selfridge, R.H.3
-
29
-
-
0000097692
-
"Bistable MEMS relays and contact characterization"
-
Hilton Head Island, SC, Jun. 8-11
-
E. J. J. Kruglick and K. S. J. Pister, "Bistable MEMS relays and contact characterization," in Proc. IEEE Solid-State Sensor and Actuator Workshop, Hilton Head Island, SC, Jun. 8-11, 1998, pp. 333-337.
-
(1998)
Proc. IEEE Solid-State Sensor and Actuator Workshop
, pp. 333-337
-
-
Kruglick, E.J.J.1
Pister, K.S.J.2
-
30
-
-
0033138336
-
"Optical fiber switches based on full wafer silicon micromachining"
-
Jun
-
M. Hoffmann, P. Kopka, T. Gross, and E. Voges, "Optical fiber switches based on full wafer silicon micromachining," J. Micromech. Microeng., vol. 9, no. 2, pp. 151-155, Jun. 1999.
-
(1999)
J. Micromech. Microeng.
, vol.9
, Issue.2
, pp. 151-155
-
-
Hoffmann, M.1
Kopka, P.2
Gross, T.3
Voges, E.4
-
31
-
-
0036572963
-
"Fabrication of MEMS devices by using anhydrous HF gas-phase etching with alcoholic vapor"
-
W. I. Jang, C. A. Choi, M. L. Lee, C. H. Jun, and Y. T. Kim, "Fabrication of MEMS devices by using anhydrous HF gas-phase etching with alcoholic vapor," J. Micromech. Microeng., vol. 12, no. 3, pp. 297-306, 1996.
-
(1996)
J. Micromech. Microeng.
, vol.12
, Issue.3
, pp. 297-306
-
-
Jang, W.I.1
Choi, C.A.2
Lee, M.L.3
Jun, C.H.4
Kim, Y.T.5
-
32
-
-
0025600732
-
"On a nonvolatile memory cell based on micro-electro-mechanics"
-
Napa Valley, CA, Feb. 11-14
-
B. Hälg, "On a nonvolatile memory cell based on micro-electro-mechanics," in Proc. IEEE Micro Electro Mechanical Systems, Napa Valley, CA, Feb. 11-14, 1990, pp. 172-176.
-
(1990)
Proc. IEEE Micro Electro Mechanical Systems
, pp. 172-176
-
-
Hälg, B.1
-
33
-
-
0042874104
-
"On a tunable bistable MEMS - Theory and experiment"
-
M. Saif, "On a tunable bistable MEMS - Theory and experiment," J. Microelectromech. Syst., vol. 9, pp. 157-170, 2000.
-
(2000)
J. Microelectromech. Syst.
, vol.9
, pp. 157-170
-
-
Saif, M.1
-
34
-
-
0033693245
-
"IC-compatible polysilicon surface micromachining"
-
J. J. Sniegowski and M. P. de Boer, "IC-compatible polysilicon surface micromachining," Annu. Rev. Mater. Sci., vol. 30, pp. 299-333, 2000.
-
(2000)
Annu. Rev. Mater. Sci.
, vol.30
, pp. 299-333
-
-
Sniegowski, J.J.1
de Boer, M.P.2
-
35
-
-
1542642469
-
"Design optimization of a fully-compliant bistable micro-mechanism"
-
New York, NY, Nov. 11-16
-
B. D. Jensen, M. B. Parkinson, K. Kurabayashi, L. L. Howell, and M. S. Baker, "Design optimization of a fully-compliant bistable micro-mechanism," in Proc. ASME IMECE 2001, New York, NY, Nov. 11-16, 2001.
-
(2001)
Proc. ASME IMECE 2001
-
-
Jensen, B.D.1
Parkinson, M.B.2
Kurabayashi, K.3
Howell, L.L.4
Baker, M.S.5
-
36
-
-
1942500874
-
"A curved-beam bistable mechanism"
-
J. Qiu, J. H. Lang, and A. H. Slocum, "A curved-beam bistable mechanism," J. Microelectromech. Syst., vol. 13, pp. 137-146, 2004.
-
(2004)
J. Microelectromech. Syst.
, vol.13
, pp. 137-146
-
-
Qiu, J.1
Lang, J.H.2
Slocum, A.H.3
-
37
-
-
0032027788
-
"Elimination of extra spring effect at the step-up anchor of surface-micromachined structure"
-
J. J.-Y. Gill, L.V. Ngo, P. R. Nelson, and C.-J. Kim, "Elimination of extra spring effect at the step-up anchor of surface-micromachined structure," J. Microelectromech. Syst., vol. 7, pp. 114-121, 1998.
-
(1998)
J. Microelectromech. Syst.
, vol.7
, pp. 114-121
-
-
Gill, J.J.-Y.1
Ngo, L.V.2
Nelson, P.R.3
Kim, C.-J.4
-
38
-
-
0036906242
-
"Integrated measurement-modeling approaches for evaluating residual stress using micromachined fixed-fixed beams"
-
M. S. Baker,M. P. de Boer, N. F. Smith, L. K.Warne, and M. B. Sinclair, "Integrated measurement-modeling approaches for evaluating residual stress using micromachined fixed-fixed beams," J. Microelectromech. Syst., vol. 11, pp. 743-753, 2002.
-
(2002)
J. Microelectromech. Syst.
, vol.11
, pp. 743-753
-
-
Baker, M.S.1
de Boer, M.P.2
Smith, N.F.3
Warne, L.K.4
Sinclair, M.B.5
-
39
-
-
12344270098
-
"Mitigating the effects of local elasticity at the built-in ends of beams and flexures"
-
J. W. Wittwer and L. L. Howell, "Mitigating the effects of local elasticity at the built-in ends of beams and flexures," J. Applied Mechanics, vol. 71, no. 5, pp. 748-751, 2004.
-
(2004)
J. Applied Mechanics
, vol.71
, Issue.5
, pp. 748-751
-
-
Wittwer, J.W.1
Howell, L.L.2
-
40
-
-
0038402810
-
"Side-by-side comparison of passive MEMS residual strain test structures under residual compression"
-
C. L. Muhlstein and S. B. Brown, Eds., West Conshohocken, PA, ASTM STP 1413
-
N. D. Masters, M. P. de Boer, B. D. Jensen, M. S. Baker, and D. Koester, "Side-by-side comparison of passive MEMS residual strain test structures under residual compression," in Proc. Mechanical Properties of Structural Films, C. L. Muhlstein and S. B. Brown, Eds., West Conshohocken, PA, 2001, ASTM STP 1413.
-
(2001)
Proc. Mechanical Properties of Structural Films
-
-
Masters, N.D.1
de Boer, M.P.2
Jensen, B.D.3
Baker, M.S.4
Koester, D.5
-
41
-
-
0032292269
-
"Round-robin tests of modulus and strength of polysilicon"
-
W. N. Sharpe, S. Brown, G. C. Johnson, and W. Knauss, "Round-robin tests of modulus and strength of polysilicon," in Proc. Material Research Society Symposium, vol. 518, 1998, pp. 57-65.
-
(1998)
Proc. Material Research Society Symposium
, vol.518
, pp. 57-65
-
-
Sharpe, W.N.1
Brown, S.2
Johnson, G.C.3
Knauss, W.4
-
42
-
-
0035441291
-
"Effect of specimen size on Young's modulus and fracture strength of polysilicon"
-
W. N. Sharpe, K. M. Jackson, K. J. Hemker, and Z. Xie, "Effect of specimen size on Young's modulus and fracture strength of polysilicon," J. Microelectromech. Syst., vol. 10, pp. 317-326, 2001.
-
(2001)
J. Microelectromech. Syst.
, vol.10
, pp. 317-326
-
-
Sharpe, W.N.1
Jackson, K.M.2
Hemker, K.J.3
Xie, Z.4
-
43
-
-
0345534832
-
"Tensile testing of polysilicon"
-
W. N. Sharpe, K. T. Turner, and R. L. Edwards, "Tensile testing of polysilicon," Exper. Mech., vol. 39, no. 3, pp. 162-170, 1999.
-
(1999)
Exper. Mech.
, vol.39
, Issue.3
, pp. 162-170
-
-
Sharpe, W.N.1
Turner, K.T.2
Edwards, R.L.3
-
44
-
-
0033138338
-
"Repeatability aspects in surface micromachining - Investigations on polycrystalline silicon films"
-
L. Elbrecht and J. Binder, "Repeatability aspects in surface micromachining - Investigations on polycrystalline silicon films," J. Micromech. Microeng., vol. 9, no. 2, pp. 130-134, 1999.
-
(1999)
J. Micromech. Microeng.
, vol.9
, Issue.2
, pp. 130-134
-
-
Elbrecht, L.1
Binder, J.2
-
45
-
-
0033318432
-
"Reproducibility data on SUMMiT"
-
S. Limary, H. D. Stewart, L. W. Irwin, J. McBrayer, J. J. Sniegowski, S. Montague, J. H. Smith, M. P. de Boer, and J. F. Jakubczak, "Reproducibility data on SUMMiT," in Proc. SPIE, vol. 3874, 1999, pp. 102-112.
-
(1999)
Proc. SPIE
, vol.3874
, pp. 102-112
-
-
Limary, S.1
Stewart, H.D.2
Irwin, L.W.3
McBrayer, J.4
Sniegowski, J.J.5
Montague, S.6
Smith, J.H.7
de Boer, M.P.8
Jakubczak, J.F.9
-
46
-
-
0037721313
-
"Resonant frequency method for monitoring MEMS fabrication"
-
D. M. Tanner, A. C. Owen Jr., and F. Rodriguez, "Resonant frequency method for monitoring MEMS fabrication," in Proc. SPIE, vol. 4980, 2003, pp. 220-228.
-
(2003)
Proc. SPIE
, vol.4980
, pp. 220-228
-
-
Tanner, D.M.1
Owen Jr., J.C.2
Rodriguez, F.3
-
47
-
-
78249276900
-
"Predicting the performance of a bistable micro mechanism using design-stage uncertainty analysis"
-
New Orleans, LA, Nov. 17-22, IMECE2002-33262
-
J. W. Wittwer, L. L. Howell, S. M. Wait, and M. S. Cherry, "Predicting the performance of a bistable micro mechanism using design-stage uncertainty analysis," in Proc. ASME IMECE 2002, New Orleans, LA, Nov. 17-22, 2002, IMECE2002-33262.
-
(2002)
Proc. ASME IMECE 2002
-
-
Wittwer, J.W.1
Howell, L.L.2
Wait, S.M.3
Cherry, M.S.4
-
48
-
-
0031382548
-
"Understanding across chip line width variation: The first step toward optical proximity correction"
-
L. W. Liebmann, A. F. Molless, R. A. Ferguson, A. K. Wong, and S. M. Mansfield, "Understanding across chip line width variation: The first step toward optical proximity correction," in Proc. SPIE, vol. 3051, 1997, pp. 124-136.
-
(1997)
Proc. SPIE
, vol.3051
, pp. 124-136
-
-
Liebmann, L.W.1
Molless, A.F.2
Ferguson, R.A.3
Wong, A.K.4
Mansfield, S.M.5
-
49
-
-
32244441598
-
-
Sandia MEMS Advanced Design Short Course
-
Reproducibility Data on SUMMiT V™, Sandia MEMS Advanced Design Short Course, 2004.
-
(2004)
Reproducibility Data on SUMMiT V™
-
-
-
50
-
-
84858317842
-
"A second-order method for assembly tolerance analysis"
-
DETC99/DAC-8707
-
C. G. Glancy and K. W. Chase, "A second-order method for assembly tolerance analysis," in Proc. 1999 ASME DETC, 1999, DETC99/DAC-8707.
-
(1999)
Proc. 1999 ASME DETC
-
-
Glancy, C.G.1
Chase, K.W.2
-
51
-
-
0042470612
-
"The use of metamodeling techniques for optimization under uncertainty"
-
R. Jin, X. Du, and W. Chen, "The use of metamodeling techniques for optimization under uncertainty," Struct. Multidisc. Optim., vol. 25, pp. 99-116, 2003.
-
(2003)
Struct. Multidisc. Optim.
, vol.25
, pp. 99-116
-
-
Jin, R.1
Du, X.2
Chen, W.3
-
52
-
-
84888831107
-
"On the use of statistics in design and the implications for deterministic computer experiments"
-
Sacramento, CA, DETC97/DTM-3881
-
T. W. Simpson, J. Peplinkski, P. N. Koch, and J. K. Allen, "On the use of statistics in design and the implications for deterministic computer experiments," in Proc. 1997 ASME DETC, Sacramento, CA, 1997, DETC97/ DTM-3881.
-
(1997)
Proc. 1997 ASME DETC
-
-
Simpson, T.W.1
Peplinkski, J.2
Koch, P.N.3
Allen, J.K.4
-
55
-
-
0003447196
-
"Statistical Validation of Engineering and Scientific Models: Background"
-
Sandia National Laboratories, Sandia Report SAND99-1256
-
R. G. Hills and T. G. Trucano, "Statistical Validation of Engineering and Scientific Models: Background," Sandia National Laboratories, Sandia Report SAND99-1256, 1999.
-
(1999)
-
-
Hills, R.G.1
Trucano, T.G.2
-
56
-
-
0036417337
-
"A metamodel-based approach to model validation for nonlinear finite element simulations"
-
S.W. Doebling, F. M. Hemez, J. F. Schultze, and A. L. Cundy, "A metamodel-based approach to model validation for nonlinear finite element simulations," in Proc. SPIE, vol. 4753, 2002, pp. 671-678.
-
(2002)
Proc. SPIE
, vol.4753
, pp. 671-678
-
-
Doebling, S.W.1
Hemez, F.M.2
Schultze, J.F.3
Cundy, A.L.4
-
57
-
-
0036979854
-
"Model validation via uncertainty propagation using response surface models"
-
DETC2002/DAC-34140
-
L. Baghdasaryan, W. Chen, T. Buranathiti, and J. Cao, "Model validation via uncertainty propagation using response surface models," in Proc. 2002 ASME DETC, 2002, DETC2002/DAC-34140.
-
(2002)
Proc. 2002 ASME DETC
-
-
Baghdasaryan, L.1
Chen, W.2
Buranathiti, T.3
Cao, J.4
-
59
-
-
1642514018
-
"Formulations for surrogate-based optimization under uncertainty"
-
Atlanta, GA, Sep. 4-6, AIAA-2002-5585
-
M. S. Eldred, A. A. Giunta, S. F. Wojtkiewicz Jr., and T. G. Trucano, "Formulations for surrogate-based optimization under uncertainty," in Proc. 9th AIAA/ISSMO Symp. Multidisc. Analysis and Optim., Atlanta, GA, Sep. 4-6, 2002, AIAA-2002-5585.
-
(2002)
Proc. 9th AIAA/ISSMO Symp. Multidisc. Analysis and Optim.
-
-
Eldred, M.S.1
Giunta, A.A.2
Wojtkiewicz Jr., S.F.3
Trucano, T.G.4
-
60
-
-
0003508286
-
"A Comparison of Uncertainty and Sensitivity Analysis Techniques for Computer Models"
-
Sandia National Laboratories, Sandia Report SAND84-1461
-
R. L. Iman and J. C. Helton, "A Comparison of Uncertainty and Sensitivity Analysis Techniques for Computer Models," Sandia National Laboratories, Sandia Report SAND84-1461, 1984.
-
(1984)
-
-
Iman, R.L.1
Helton, J.C.2
|