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Volumn 4755, Issue , 2002, Pages 126-135
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Parametric yield optimization of MEMS
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Author keywords
Design of Experiments; MEMS resonator; Parametric yield management; Statistical optimization; Thick Copper Post Inductors
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Indexed keywords
ALGORITHMS;
INDUCTANCE;
INTEGRATED CIRCUIT MANUFACTURE;
OPTICAL SWITCHES;
OPTIMIZATION;
RESONATORS;
STATISTICAL METHODS;
STATISTICAL OPTIMIZATION;
MICROELECTROMECHANICAL DEVICES;
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EID: 6444244390
PISSN: 0277786X
EISSN: None
Source Type: Journal
DOI: 10.1117/12.462802 Document Type: Article |
Times cited : (2)
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References (13)
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