Distinguishing and identifying point and extended defects in DLTS measurements

Materials Science- Poland

Volumn 23, Issue 3, 2005, Pages 625-641

  Gelczuk, L ^a   Dabrowska Szata M ^a   Jozwiak G ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Deep levels; Defect identification; DLTS; Extended defects; Point defects

Indexed keywords

DATA REDUCTION; DEEP LEVEL TRANSIENT SPECTROSCOPY; HETEROJUNCTIONS; POINT DEFECTS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR MATERIALS;

DEEP LEVELS; EXTENDED DEFECTS;

MATERIALS SCIENCE;

EID: 28544438780     PISSN: 01371339     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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