Factors affecting phase and height contrast of diblock copolymer PS-b-PEO thin films in dynamic force mode atomic force microscopy

Applied Surface Science

Volumn 252, Issue 4, 2005, Pages 1092-1100

  Wang, H ^a   Djurisic A B ^a   Chan, W K ^a   Xie, M H ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Atomic force microscopy; Block copolymers; Phase contrast

Indexed keywords

ATOMIC FORCE MICROSCOPY; ENERGY DISSIPATION; PHASE SEPARATION; PLASTIC FILMS; STIFFNESS; SURFACE PHENOMENA;

DOMAIN SIZES; MICROPHASE SEPARATION; PHASE CONTRAST; POLYMER SYSTEM;

BLOCK COPOLYMERS;

EID: 26444472768     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.02.034     Document Type: Article

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