High resolution electron microscopy of ordered polymers and organic molecular crystals: Recent developments and future possibilities

Journal of Polymer Science, Part B: Polymer Physics

Volumn 43, Issue 14, 2005, Pages 1749-1778

  Martin, David C ^a   Chen, Jihua ^a   Yang, Junyan ^a   Drummy, Lawrence F ^b   Kübel, Christian ^c  

^a UNIVERSITY OF MICHIGAN   (United States)

^b WRIGHT PATTERSON AIR FORCE BASE   (United States)

^c FRAUNHOFER INSTITUTE FOR MANUFACTURING TECHNOLOGY AND ADVANCED MATERIALS IFAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); ELECTRON BEAM IRRADIATION; ORDERED POLYMERS; ORGANIC MOLECULAR CRYSTALS;

DNA; ELECTRIC POTENTIAL; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; FERROELECTRICITY; IMAGING SYSTEMS; MICROSTRUCTURE; MOLECULAR CRYSTALS; PHASE TRANSITIONS; POLYMERS;

HIGH RESOLUTION ELECTRON MICROSCOPY;

EID: 23844466258     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.20419     Document Type: Review

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