An Atomic-Level View of Melting Using Femtosecond Electron Diffraction

Science

Volumn 302, Issue 5649, 2003, Pages 1382-1385

  Siwick, Bradley J ^a   Dwyer, Jason R ^a   Jordan, Robert E ^a   Miller, R J Dwayne ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; LASER PULSES; PHASE TRANSITIONS; SENSITIVITY ANALYSIS; THIN FILMS;

ELECTRON PULSES; LIQUID STRUCTURE;

MELTING;

ALUMINUM;

ALUMINUM; DIFFRACTION; ELECTRON; MELTING;

ARTICLE; ATOMIC PARTICLE; CHEMICAL STRUCTURE; CRYSTALLIZATION; DYNAMICS; ELECTRON DIFFRACTION; FILM; LASER; LIQUID; MELTING POINT; OBSERVATION; PHASE TRANSITION; PRIORITY JOURNAL; SOLID; TIME;

EID: 0345306759     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1090052     Document Type: Article

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30. Supported by the Canada Foundation for innovation, the Ontario Innovation Trust, the Natural Sciences and Engineering Research Council of Canada, and the Connaught Fund. J.R.D. gratefully acknowledges the support of a Walter C. Sumner fellowship.