Variable coherence microscopy: A rich source of structural information from disordered materials

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 52, Issue 2, 1996, Pages 212-220

  Treacy, M M J ^a   Gibson, J M ^b  

^a NEC LABORATORIES AMERICA   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000605310     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767395012876     Document Type: Article

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