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Volumn 304, Issue 5667, 2004, Pages 80-84

Ultrafast Electron Crystallography of Interfacial Water

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; HYDROPHILICITY; ICE; SURFACE STRUCTURE; THERMAL EFFECTS;

EID: 1842581809     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1094818     Document Type: Article
Times cited : (245)

References (39)
  • 5
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    • C. A. Tulket al, Science 297, 1320 (2002).
    • (2002) Science , vol.297 , pp. 1320
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  • 17
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    • J. R. Helliwell, P. M. Rentzepis, Eds. (Oxford Univ. Press, New York)
    • H. E. Elsayed-Ali, P. Weber, in Time-Resolved Diffraction, J. R. Helliwell, P. M. Rentzepis, Eds. (Oxford Univ. Press, New York, 1997), pp. 284-322.
    • (1997) Time-Resolved Diffraction , pp. 284-322
    • Elsayed-Ali, H.E.1    Weber, P.2
  • 19
    • 1842551819 scopus 로고    scopus 로고
    • note
    • The chlorine atoms do not react with the water molecules, as evidenced by the reproducibility of the distinctive surface diffraction features for many runs of laser annealing and adsorption-deposition cycles. The hydrophilicity of chlorine-terminated Si surface is apparent from the observed small contact angle that the water droplet makes with the surface, in contrast with the observations made on hydrophobic surfaces.
  • 20
    • 1842447270 scopus 로고    scopus 로고
    • note
    • 2, and the accumulated exposure per image frame was less than 5000 shots. A total of five iterative frames were taken at each delay time. This was done to prevent any long-term modification to the ice layers, e.g., annealing and sublimation.
  • 21
    • 1842551818 scopus 로고    scopus 로고
    • note
    • The pulses for diffraction were generated using Williamson-Mourou streak camera arrangement (34) and with an electron gun focusing system (77) developed for ultrashort time resolution (16, 22, 35-37). We achieved ∼1 ps resolution in the development of ultrafast gas phase electron diffraction (22), and in the new UEC machine a 300 to 600 fs resolution (16, 37) was obtained. For the geometry of reflection studied here, the overall resolution is limited by the difference in transit time on the surface.
  • 28
    • 1842447272 scopus 로고    scopus 로고
    • note
    • This temperature is determined from the integrated intensity change of the diffraction (0,0) spot of the substrate using the Sears and Shelley (38) tabulated temperature dependent Debye-Waller factors.
  • 29
    • 1842604040 scopus 로고    scopus 로고
    • note
    • ref) and referencing to an image eliminates the incoherent background.
  • 32
    • 1842551822 scopus 로고    scopus 로고
    • in preparation
    • C. Y. Ruan et al., in preparation.
    • Ruan, C.Y.1
  • 37
    • 0842289880 scopus 로고    scopus 로고
    • Springer Series in Optical Sciences, F. Krausz, G. Korn, P. Corkum, I. Walmsley, Eds. (Springer-Verlag, Berlin)
    • V. A. Lobastov et al., in Ultrafast Optics IV, Springer Series in Optical Sciences, F. Krausz, G. Korn, P. Corkum, I. Walmsley, Eds. (Springer-Verlag, Berlin, 2003), pp. 413-429.
    • (2003) Ultrafast Optics IV , pp. 413-429
    • Lobastov, V.A.1
  • 39
    • 1842499489 scopus 로고    scopus 로고
    • note
    • Supported bythe National Science Foundation. Some support was also provided by the Air Force Office of Scientific Research. F.V. acknowledges partial financial support from the Swiss National Science Foundation, and S.C. acknowledges a Millikan fellowship at Caltech, We thank N. Lewis and L. Webb for functionalizing the silicon surface.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.