SCOPUS 정보 검색 플랫폼

Volumn 43, Issue 26, 2002, Pages 7493-7496

The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass

(4) Loos, Joachim a Van Duren, Jeroen K J b Morrissey, Francis c Janssen, René A J b

a EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

b EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

c Thermo Fisher Scientific (United States)

Author keywords

Focused ion beam; Scanning electron microscope; Transmission electron microscopy

Indexed keywords

GLASS; SOLAR CELLS; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

HYBRID STRUCTURES;

POLYMERS;

GLASS; ION; POLYMER;

ARTICLE; CELL; DEVICE INFECTION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; STANDARD; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

GLASS;

EID: 0037153056 PISSN: 00323861 EISSN: None Source Type: Journal
DOI: 10.1016/S0032-3861(02)00643-2 Document Type: Article

Times cited : (49)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.