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Volumn 278, Issue 5337, 1997, Pages 449-452

Direct visualization of individual cylindrical and spherical supramolecular dendrimers

Author keywords

[No Author keywords available]

Indexed keywords

DENDRIMER;

EID: 0030662396     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.278.5337.449     Document Type: Article
Times cited : (530)

References (54)
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    • h 30 (4.27) k; 3, k-15 (31.5) Cub 140 (1.63) i, i 127 (1.17) Cub -17 (31.0) k; 4, k 58 (31.83) Cub 108 (0.41) i, i 99 (0.11) Cub 93 (0.03) k-23 (7.15) k.
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    • 4). Brightfield TEM images were obtained with a JEOL 100CX TEM, operated at 100 kV. Thin films of the spherical supramolecular dendrimers were prepared on the same support by cooling at a rate of 0.1°C per minute from 5°C above to 25°C below the isotropization temperature [i in (14)].
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    • note
    • The inclination θ of neighboring columns was measured as a function of z, the distance from the dislocation along the Burger's vector (that is, perpendicular to the central column), and λ was determined most accurately by fitting the equation θ = 1/4√π a/√λz
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    • The [001] zone axis is typically perpendicular to the film surface, and the ED pattern shown in Fig. 5C [containing the (200) and (210) reflections] was obtained at normal beam incidence. In addition, the following low-angle reflections in the [001] zone were observed: (400), (320), (220) and (310), listed in order of decreasing intensity. At wide angles, a diffuse ring was observed centered at 4.6 Å, indicating that the structure at the atomic level is disordered. The (211) reflection, which is strong and of comparable intensity to the (200) and (210) reflections, can be observed as expected, if the specimen is tilted 27° or 45° about the [100] axis.
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    • 4 staining. Identical ED patterns are obtained from unstained samples. However, the material is sensitive to the electron beam, and the low-angle reflections disappear during irradiation, because the electron beam induces structural rearrangements which destroy the order. Stained samples are more resistant to the electron beam.
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    • Supported by NSF and the Engineering and Physical Science Research Council, UK
    • Supported by NSF and the Engineering and Physical Science Research Council, UK.


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