-
3
-
-
0033876688
-
-
B. J. Skromme, E. Luckowski, K. Moore, M. Bhatnagar, C. E. Weitzel, T. Gehoski, and D. Ganser, J. Electron. Mater. 29, 376 (2000).
-
(2000)
J. Electron. Mater.
, vol.29
, pp. 376
-
-
Skromme, B.J.1
Luckowski, E.2
Moore, K.3
Bhatnagar, M.4
Weitzel, C.E.5
Gehoski, T.6
Ganser, D.7
-
4
-
-
0037098088
-
-
C. Raynaud, K. Isoird, M. Lazar, C. M. Johnson, and N. Wright, J. Appl. Phys. 91, 9841 (2002).
-
(2002)
J. Appl. Phys.
, vol.91
, pp. 9841
-
-
Raynaud, C.1
Isoird, K.2
Lazar, M.3
Johnson, C.M.4
Wright, N.5
-
6
-
-
0043265143
-
-
F. Roccaforte, F. La Via, V. Raineri, L. Calcagno, P. Musumeci, and G. G. Condorelli, Appl. Phys. A 77, 827 (2003).
-
(2003)
Appl. Phys. A
, vol.77
, pp. 827
-
-
Roccaforte, F.1
La Via, F.2
Raineri, V.3
Calcagno, L.4
Musumeci, P.5
Condorelli, G.G.6
-
7
-
-
0038311926
-
-
F. Roccaforte, F. La Via, V. Raineri, R. Pierobon, and E. Zanoni, J. Appl. Phys. 93, 9137 (2003).
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 9137
-
-
Roccaforte, F.1
La Via, F.2
Raineri, V.3
Pierobon, R.4
Zanoni, E.5
-
9
-
-
0001637312
-
-
edited by G. L.Harris (INSPEC, IEE, London
-
K. Wongchotigul, in Properties of Silicon Carbide, edited by, G. L. Harris, (INSPEC, IEE, London, 1995), pp. 157-161.
-
(1995)
Properties of Silicon Carbide
, pp. 157-161
-
-
Wongchotigul, K.1
-
10
-
-
0000583638
-
-
D. Dwight, M. V. Rao, O. W. Holland, G. Kelner, P. H. Chi, J. Kretchmer, and M. Ghezzo, J. Appl. Phys. 82, 5327 (1997).
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 5327
-
-
Dwight, D.1
Rao, M.V.2
Holland, O.W.3
Kelner, G.4
Chi, P.H.5
Kretchmer, J.6
Ghezzo, M.7
-
12
-
-
0141831098
-
-
M. Lazar, C. Raynaud, D. Planson, J.-P. Chante, M.-L. Locatelli, L. Ottaviani, and Ph. Godignon, J. Appl. Phys. 94, 2992 (2003).
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 2992
-
-
Lazar, M.1
Raynaud, C.2
Planson, D.3
Chante, J.-P.4
Locatelli, M.-L.5
Ottaviani, L.6
Godignon, Ph.7
-
14
-
-
0032121583
-
-
K. J. Schoen, J. M. Woodall, J. A. Cooper, and M. R. Melloch, IEEE Trans. Electron Devices 45, 1595 (1998).
-
(1998)
IEEE Trans. Electron Devices
, vol.45
, pp. 1595
-
-
Schoen, K.J.1
Woodall, J.M.2
Cooper, J.A.3
Melloch, M.R.4
-
15
-
-
0035821026
-
-
D. Åberg, H. Allen, P. Pellegrino, and B. G. Svensson, Appl. Phys. Lett. 78, 2908 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 2908
-
-
Åberg, D.1
Allen, H.2
Pellegrino, P.3
Svensson, B.G.4
-
16
-
-
0346669750
-
-
H. Matsuura, K. Aso, S. Kagamihara, H. Iwata, T. Ishida, and K. Nishikawa, Appl. Phys. Lett. 83, 4981 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 4981
-
-
Matsuura, H.1
Aso, K.2
Kagamihara, S.3
Iwata, H.4
Ishida, T.5
Nishikawa, K.6
-
18
-
-
0037768535
-
-
F. Nava, E. Vittone, P. Vanni, G. Verzellesi, P. G. Fuochi, C. Lanzieri, and M. Glaser, Nucl. Instrum. Methods Phys. Res. A 505, 645 (2003).
-
(2003)
Nucl. Instrum. Methods Phys. Res. A
, vol.505
, pp. 645
-
-
Nava, F.1
Vittone, E.2
Vanni, P.3
Verzellesi, G.4
Fuochi, P.G.5
Lanzieri, C.6
Glaser, M.7
-
24
-
-
0039782194
-
-
J. S. Kim, H. H. Choi, S. H. Son, and S. Y. Choi, Appl. Phys. Lett. 79, 860 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 860
-
-
Kim, J.S.1
Choi, H.H.2
Son, S.H.3
Choi, S.Y.4
-
26
-
-
0033513767
-
-
M. J. Legodi, F. D. Auret, S. A. Goodman, and J. B. Malherbe, Nucl. Instrum. Methods Phys. Res. B 148, 441 (1998).
-
(1998)
Nucl. Instrum. Methods Phys. Res. B
, vol.148
, pp. 441
-
-
Legodi, M.J.1
Auret, F.D.2
Goodman, S.A.3
Malherbe, J.B.4
-
27
-
-
20644466659
-
-
F. Roccaforte, C. Bongiorno, F. La Via, and V. Raineri, Appl. Phys. Lett. 85, 6152 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 6152
-
-
Roccaforte, F.1
Bongiorno, C.2
La Via, F.3
Raineri, V.4
-
29
-
-
0033101204
-
-
D. Defives, O. Noblanc, C. Dua, C. Brylinski, M. Barthula, V. Aubry-Fortuna, and F. Meyer, IEEE Trans. Electron Devices 46, 449 (1999).
-
(1999)
IEEE Trans. Electron Devices
, vol.46
, pp. 449
-
-
Defives, D.1
Noblanc, O.2
Dua, C.3
Brylinski, C.4
Barthula, M.5
Aubry-Fortuna, V.6
Meyer, F.7
-
30
-
-
4244085959
-
-
D. Defives, O. Durand, F. Wyezisk, J. Oliver, O. Noblank, and C. Brylinski, Mater. Sci. Forum 338-342, 411 (2000).
-
(2000)
Mater. Sci. Forum
, vol.338-342
, pp. 411
-
-
Defives, D.1
Durand, O.2
Wyezisk, F.3
Oliver, J.4
Noblank, O.5
Brylinski, C.6
-
31
-
-
0036133201
-
-
F. La Via, F. Roccaforte, A. Makhtari, V. Raineri, P. Musumeci, and L. Calcagno, Microelectron. Eng. 60, 269 (2002).
-
(2002)
Microelectron. Eng.
, vol.60
, pp. 269
-
-
La Via, F.1
Roccaforte, F.2
Makhtari, A.3
Raineri, V.4
Musumeci, P.5
Calcagno, L.6
-
35
-
-
0000499612
-
-
J. Sullivan, R. T. Tung, M. Pinto, and W. R. Graham, J. Appl. Phys. 70, 7403 (1991).
-
(1991)
J. Appl. Phys.
, vol.70
, pp. 7403
-
-
Sullivan, J.1
Tung, R.T.2
Pinto, M.3
Graham, W.R.4
-
37
-
-
0035882131
-
-
H. J. Im, Y. Ding, J. P. Pelz, and W. J. Choyke, Phys. Rev. B 64, 075310 (2001).
-
(2001)
Phys. Rev. B
, vol.64
, pp. 075310
-
-
Im, H.J.1
Ding, Y.2
Pelz, J.P.3
Choyke, W.J.4
-
42
-
-
0346150162
-
-
F. Roccaforte, F. La Via, V. Raineri, L. Calcagno, and F. Mangano, Appl. Phys. Lett. 83, 4181 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 4181
-
-
Roccaforte, F.1
La Via, F.2
Raineri, V.3
Calcagno, L.4
Mangano, F.5
-
44
-
-
0035920990
-
-
F. Giannazzo, L. Calcagno, V. Raineri, L. Ciampolini, M. Cippa, and E. Napolitani, Appl. Phys. Lett. 79, 1211 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 1211
-
-
Giannazzo, F.1
Calcagno, L.2
Raineri, V.3
Ciampolini, L.4
Cippa, M.5
Napolitani, E.6
-
46
-
-
0004052502
-
-
edited by N. H.March (Academic, London
-
P. Blood and J. W. Orton, The Electrical Characterization of Semiconductors: Majority Carriers and Electron States, edited by, N. H. March, (Academic, London 1992), p. 297.
-
(1992)
The Electrical Characterization of Semiconductors: Majority Carriers and Electron States
, pp. 297
-
-
Blood, P.1
Orton, J.W.2
-
47
-
-
0037449336
-
-
I. Pintilie, L. Pintilie, K. Irmscher, and B. Thomas, Appl. Phys. Lett. 81, 4841 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 4841
-
-
Pintilie, I.1
Pintilie, L.2
Irmscher, K.3
Thomas, B.4
-
48
-
-
0031188515
-
-
T. Dalibor, G. Pensl, H. Matsunami, T. Kimoto, W. J. Chokye, A. Schöner, and N. Nordell, Phys. Status Solidi A 162, 199 (1997).
-
(1997)
Phys. Status Solidi A
, vol.162
, pp. 199
-
-
Dalibor, T.1
Pensl, G.2
Matsunami, H.3
Kimoto, T.4
Chokye, W.J.5
Schöner, A.6
Nordell, N.7
|