메뉴 건너뛰기




Volumn 68, Issue 2, 2005, Pages 145-156

Monte Carlo study of surface and line-width roughness of resist film surfaces during dissolution

Author keywords

Dissolution; Lattice models of polymer chains; Line edge roughness; MC; Surface roughness

Indexed keywords

LATTICE MODELS OF POLYMER CHAINS; LINE-EDGE ROUGHNESS; MOLECULAR SIMULATION; MONTE CARLO STUDY;

EID: 17444370545     PISSN: 03784754     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matcom.2004.10.006     Document Type: Article
Times cited : (14)

References (50)
  • 1
    • 84888891003 scopus 로고    scopus 로고
    • http://public.itrs.net/Files/2002Update/2002Update.pdf.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.