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Journal of Alloys and Compounds

Volumn 388, Issue 2, 2005, Pages 177-185

Characterisation of oxidised gadolinium film deposited on Si (1 0 0) substrate

(1) Dakhel, A A a

a UNIVERSITY OF BAHRAIN (Bahrain)

Author keywords

Dielectric phenomena; Gadolinium oxide; Insulating films; SCLC mechanism

Indexed keywords

DIELECTRIC PHENOMENA; GADOLINIUM OXIDE; INSULATING FILMS; SCLC MECHANISM;

ABSORPTION SPECTROSCOPY; DEPOSITION; DIELECTRIC PROPERTIES; FILM GROWTH; FLUORESCENCE; GADOLINIUM COMPOUNDS; LIGHT ABSORPTION; OXIDATION; QUARTZ; SUBSTRATES; X RAY DIFFRACTION;

THIN FILMS;

EID: 11344272232 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2004.07.019 Document Type: Article

Times cited : (18)

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