Observation of Poole-Frenkel effect saturation in SiO2 and other insulating films

Thin Solid Films

Volumn 352, Issue 1-2, 1999, Pages 195-204

  Harrell, W R ^a   Frey, J ^b  

^a AMRL   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Conductivity; Dielectrics; Silicon nitride; Silicon oxide

Indexed keywords

EID: 0000665814     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00344-2     Document Type: Article

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