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Applied Surface Science

Volumn 181, Issue 1-2, 2001, Pages 128-138

Dielectric relaxation in polycrystalline thin films of In 2 Te 3

(1) Seyam, M A M a

a Roxy (Egypt)

Author keywords

AC conductivity; Dielectric measurements; In 2 Te 3; Relaxation time measurements; Semiconductors; Thin films

Indexed keywords

ACTIVATION ENERGY; CARRIER CONCENTRATION; DIELECTRIC RELAXATION; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTROCHEMICAL ELECTRODES; EVAPORATION; GLASS; HIGH TEMPERATURE EFFECTS; OHMIC CONTACTS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING INDIUM; STOICHIOMETRY; SUBSTRATES; SURFACE PHENOMENA;

POLYCRYSTALLINE THIN FILMS;

THIN FILMS;

EID: 0035801778 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(01)00378-6 Document Type: Article

Times cited : (71)

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