A comparison of the DC conduction properties in evaporated cadmium selenide thin films using gold and aluminium electrodes

Thin Solid Films

Volumn 317, Issue 1-2, 1998, Pages 409-412

  Oduor, A O ^a   Gould, R D ^a  

^a KEELE UNIVERSITY   (United Kingdom)

Author keywords

Aluminium; DC conduction; Thin films

Indexed keywords

ALUMINUM; CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; ELECTRIC SPACE CHARGE; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; EVAPORATION; GOLD; PHYSICAL PROPERTIES; SANDWICH STRUCTURES; SEMICONDUCTING CADMIUM COMPOUNDS; VACUUM APPLICATIONS;

CURRENT DENSITY VOLTAGE MEASUREMENT; DIFFERENTIAL CAPACITANCE VOLTAGE MEASUREMENT; FILM LOWERING COEFFICIENT; INTERFACIAL PROPERTIES; OHMIC CONDUCTION; POOLE-FRENKLE EFFECT; SCHOTTKY EMISSION; SPACE CHARGE LIMITED CONDUCTION;

THIN FILMS;

EID: 0032048376     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00575-0     Document Type: Article

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