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Volumn 17, Issue 1-4, 2003, Pages 572-578

Coulomb blockade, single-electron transistors and circuits in silicon

Author keywords

Coulomb blockade; Single electron devices; Single electron memory

Indexed keywords

COULOMB BLOCKADE; ELECTRON TRANSITIONS; ELECTRONS; TRANSISTORS;

EID: 0037391588     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(02)00874-3     Document Type: Conference Paper
Times cited : (24)

References (45)
  • 2
    • 0003423226 scopus 로고
    • Single charge tunneling - Coulomb blockade phenomena in nanostructures
    • New York: Plenum Press
    • Grabert H., Devoret M.H. Single Charge Tunneling - Coulomb Blockade Phenomena in Nanostructures, NATO ASI Series. 1992;Plenum Press, New York.
    • (1992) NATO ASI Series
    • Grabert, H.1    Devoret, M.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.