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0034429743
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Amorphous and heterogeneous silicon thin films
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editors, Warrendale PA: Materials Research Society, 2001, These proceedings include the research contributions presented at the Spring 2000 Meeting of the Materials Research Society, held April 2000 in San Francisco CA, USA
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Materials Research Society Symposium Proceedings
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Collins, R.W.1
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0035556448
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Amorphous and heterogeneous silicon-based thin films
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editors, Warrendale PA: Materials Research Society, 2001, These proceedings include the research contributions presented at the Spring 2001 Meeting of the Materials Research Society, held April 2001 in San Francisco CA, USA
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Materials Research Society Symposium Proceedings
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Stutzmann, M.1
Boyce, J.B.2
Cohen, J.D.3
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0036540597
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Amorphous and microcrystalline semiconductors-science and technology
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editors, These proceedings include the most Evolutionup- to-date research results available on PECVD of amorphous and microcrystalline silicon thin films. These results were presented at the 19th International Conference on Amorphous and Microcrystal- line Semiconductors, held August 2001 in Nice, France
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Proceedings of the 19th International Conference on Amorphous and Microcrystalline Semiconductors, J Non-Cryst Solids
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Godet, C.1
Equer, B.2
Mencaraglia, D.3
Solomon, I.4
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Plasma and surface reactions for obtaining low defect density amorphous silicon at high growth rates
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J Vac Sci Technol A
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Matsuda, A.1
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High-rate growth of stable a-Si:H
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Mater Res Soc Symp Proc
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Takagi, T.1
Hayashi, R.2
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Takai, M.6
Kondo, M.7
Matsuda, A.8
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26
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0000182211
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Deposition mechanism of hydrogenated amorphous silicon
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This article presents a critique of previous models of Si:H film growth by PECVD, and suggests alternative approaches to explain selected experimental results
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J Appl Phys
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Robertson, J.1
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0035556387
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Phase diagrams for the optimization of rf plasma enhanced chemical vapor deposition of a-Si:H: Variations in plasma power and substrate temperature
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These authors describe in detail the application of deposition phase diagrams to guide the optimization of PECVD a-Si:H for solar cell applications
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(2001)
Mater Res Soc Symp Proc
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Ferlauto, A.S.1
Koval, R.J.2
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Collins, R.W.4
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Extended phase diagrams for guiding plasma-enhanced chemical vapor deposition of silicon thin films for photovoltaic applications
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This article summarizes the use of phase diagrams for guiding PECVD of a-Si:H for high performance solar cells. The importance of high gas pressures is emphasized for achieving device quality a-Si:H films at high deposition rates
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(2002)
Appl Phys Lett
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Ferlauto, A.S.1
Koval, R.J.2
Wronski, C.R.3
Collins, R.W.4
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31
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0034273285
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Fast diffusion of H and creation of dangling bonds in hydrogenated amorphous silicon studied by in situ ESR
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These authors have applied electron spin resonance (ESR) to study the interaction of atomic hydrogen with the surface of a-Si:H at different temperatures. This work demonstrates the unique power of in situ ESR for characterizof ing the depth distribution of dangling bonds in growing Si:H films
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Rev Lett
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Das, U.K.1
Yasuda, T.2
Yamasaki, S.3
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Surface reactions in very low temperature (<150 °C) hydrogenated amorphous silicon deposition, and applications to thin film transistors
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J Non-Cryst Solids
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Parsons, G.N.1
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4243616227
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Surface transport kinetics in low temperaproperty ture silicon deposition determined from topography evolution
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In this study, it is argued that the diffusion of adsorbed species dominates the surface transport in PECVD of a-Si:H. Surface morphological data obtained on films deposited at different substrate temperatures are consistent with an activation barrier for diffusion of 0.2 eV
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Phys Rev B
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Bray, K.R.1
Parsons, G.N.2
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0037050249
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Ab initio analysis of silyl precursor nearphysisorption and hydrogen abstraction during low temperature silicon deposition
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3 radical in a process that leaves a surface dangling bond. An activation energy range of 0.4060.22 eV is obtained, based on results from two different computational methods
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Surf Sci
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Gupta, A.1
Yang, H.2
Parsons, G.N.3
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36
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0002435496
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Experimental evidence for an inhomogeneous surface dangling bond limited growth mechanism in a-Si:H
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These authors propose that adsorbed radicals diffusing on the a-Si:H surface during PECVD are more likely to encounter dangling bonds that form preferentially at step-like and kink-like sites on the surface
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(2000)
J Non-Cryst Solids
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Flewitt, A.J.1
Robertson, J.2
Milne, W.I.3
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37
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0034431262
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Surface roughness evolution of a-Si:H growth and its relation to the growth mechanism
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In this article, a new model for a-Si:H film growth is proposed based on the concept of reactive site diffusion. In this model, reactive sites at step edges exhibit a higher activation energy for diffusion than sites on terraces
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(2000)
Mater Res Soc Symp Proc
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Smets, A.H.M.1
Schram, D.C.2
van de Sanden, M.C.M.3
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0001603830
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Chemical-equilibrium model of optimal a-Si:H growth tofrom SiH
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Phys Rev B
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Winer, K.1
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44
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0034429786
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Nucleation mechanism of microcrystalline silicon studied by real time spectroscopic ellipsometry and infrared spectroscopy
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This article reviews the authors' research on the use of real time spectroscopic ellipsometry and infrared reflection spectroscopy for the identification of the nearphysisorption surface changes in Si-H bonding that presage the nucleation of mc-Si:H from the a-Si:H phase
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(2000)
Mater Res Soc Symp Proc
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Fujiwara, H.1
Toyoshima, Y.2
Kondo, M.3
Matsuda, A.4
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45
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0037137889
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Microcrystalline nucleation sites in the sub-surface of hydrogenated amorphous silicon
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-1 and are tentatively attributed to H inserted at weak Si-Si bonds in the 1-2 monolayers below the surface of a-Si:H. It is further proposed that clusters of such bonding units are required to initiate a single nucleation event
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(2002)
Surf Sci
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Fujiwara, H.1
Kondo, M.2
Matsuda, A.3
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46
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0036536796
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Depth profiling of silicon-hydrogen bonding modes in amorphous and microcrystalline Si:H thin films by real-time infrared spectroscopy and spectroscopic ellipsometry
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This article describes how the depth distribution of the H-content in a-Si:H can be extracted from real time optical studies. From this research, it is suggested that the reaction yielding Si:H microcrystallites occurs near the film surface and not in the film bulk
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(2002)
J Appl Phys
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, pp. 4181-4190
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Fujiwara, H.1
Kondo, M.2
Matsuda, A.3
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47
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0035560066
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Effect of strained Si-Si bonds in amorphous silicon incubation layer on microcrystalline silicon nucleation
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This study suggests that two ingredients are required for Si:H microcrystallite nucleation from the a-Si:H phase. First, a high level of mechanical stress is required in the film that generates strained Si-Si bonds, and second, a high atomic H content in the plasma is required so that the H inserts at the strained bonds in the near surface region
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(2001)
Mater Res Soc Symp Proc
, vol.664
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Fujiwara, H.1
Kondo, M.2
Matsuda, A.3
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49
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0035883944
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Depth distribution of hydrogen and intrinsic stress in a-Si:H films prepared from hydrogen-diluted silane
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2-dilution ratio. These results have important implications for the phase evolution in Si:H films
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(2001)
J Appl Phys
, vol.90
, pp. 3065-3068
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Danesh, P.1
Pantchev, B.2
Grambole, D.3
Schmidt, B.4
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50
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0036948898
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Thickness evolution of the micro-structural and optical properties of Si:H films in the amorphous-to-microcrystalline phase transition region
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May 20-24, New Orleans, LA. New York: IEEE, in press. In this study, real time spectroscopic ellipsometry is applied to quantify the evolution of Si:H microcrystallites that nucleate from the a-Si:H phase. The results are found to be consistent with a conical crystallite growth model
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(2002)
Conference Record of the 29th IEEE Photovoltaic Specialists Conference
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Ferlauto, A.S.1
Ferreira, G.M.2
Koval, R.J.3
Pearce, J.4
Wronski, C.R.5
Collins, R.W.6
Al-Jassim, M.M.7
Jones, K.M.8
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