The role of test protocols in automated test generation for embedded-core-based system ICs

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 18, Issue 4-5, 2002, Pages 435-454

  Marinissen, Erik Jan ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Embedded cores; Expansion; System chips; Test generation; Test protocol; Test protocol scheduling

Indexed keywords

ALGORITHMS; EMBEDDED SYSTEMS; INDUSTRIAL APPLICATIONS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; TIME DOMAIN ANALYSIS;

AUTOMATED TEST GENERATION; EMBEDDED CORE BASED SYSTEMS; SYSTEM ON CHIP TEST; TEST PROTOCOLS;

DESIGN FOR TESTABILITY;

EID: 0036693149     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1016545607915     Document Type: Article

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