Novel test methodology for core-based system LSIs and a testing time minimization problem

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 465-472

  Sugihara, Makoto ^a   Date, Hiroshi ^a   Yasuura, Hiroto ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION (ATPG); CORE BASED INTEGRATED CIRCUITS;

AUTOMATIC TESTING; BUILT-IN SELF TEST; COMBINATORIAL MATHEMATICS; LSI CIRCUITS; OPTIMIZATION; VECTORS;

INTEGRATED CIRCUIT TESTING;

EID: 0032307115     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743187     Document Type: Conference Paper

References (11)