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Volumn 5, Issue , 2001, Pages 251-254

Power constrained test scheduling using power profile manipulation

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION MODEL; BENCHMARK CIRCUIT; MANIPULATION TECHNIQUES; POWER PROFILE; TEST APPLICATION TIME; TEST SCHEDULING; TEST SCHEDULING ALGORITHM; TEST SEQUENCE;

EID: 0035012550     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (11)
  • 1
    • 0007736002 scopus 로고    scopus 로고
    • AMS Austria Mikro Systeme International AG
    • AMS. 0.35 Micron CMOS Process Parameters. Austria Mikro Systeme International AG, 1998.
    • (1998) 0.35 Micron CMOS Process Parameters
  • 2
    • 0002609165 scopus 로고
    • A neural netlist of 10 combinational benchmark designs and a special translator in fortran
    • F. Brglez and H. Fujiwara. A neural netlist of 10 combinational benchmark designs and a special translator in fortran. In Proc. of International Symposium on Circuits and Systems, pages 669-669, 1985.
    • (1985) Proc. of International Symposium on Circuits and Systems , pp. 669-669
    • Brglez, F.1    Fujiwara, H.2
  • 6
    • 0003581572 scopus 로고
    • Technical Report No. 12-93 Department of Electrical Engineering. Virginia Polytechnic Institute and State University
    • H. K. Lee and D. S. Ha. On the generation of test patterns for combinational circuits. Technical Report No. 12-93. Department of Electrical Engineering. Virginia Polytechnic Institute and State University, 1991.
    • (1991) On the Generation of Test Patterns for Combinational Circuits
    • Lee, H.K.1    Ha, D.S.2
  • 7
    • 0033743219 scopus 로고    scopus 로고
    • The left edge algorithm and the tree growing technique in block-test scheduling under power constraints
    • V. Muresan, X. Wang, and M. Vladutiu. The left edge algorithm and the tree growing technique in block-test scheduling under power constraints. In Proc. of the 18th IEEE VLSI Test Symposium, pages 417-422, 2000.
    • (2000) Proc. of the 18th IEEE VLSI Test Symposium , pp. 417-422
    • Muresan, V.1    Wang, X.2    Vladutiu, M.3
  • 8
    • 0034266584 scopus 로고    scopus 로고
    • Minimisation of power dissipation during test application in full scan sequential circuits using primary input freezing
    • September
    • N. Nicolici and B. Al-Hashimi. Minimisation of power dissipation during test application in full scan sequential circuits using primary input freezing. IEE Proceedings-Computers and Digital Techniques, 147(5). September 2000.
    • (2000) IEE Proceedings-Computers and Digital Techniques , vol.147 , Issue.5
    • Nicolici, N.1    Al-Hashimi, B.2
  • 10
    • 0032003411 scopus 로고    scopus 로고
    • ATPG for heat dissipation minimization during test application
    • February
    • S. Wang and S. Gupta. ATPG for heat dissipation minimization during test application. IEEE Transactions on Computers, 47(2):256-262, February 1998.
    • (1998) IEEE Transactions on Computers , vol.47 , Issue.2 , pp. 256-262
    • Wang, S.1    Gupta, S.2
  • 11
    • 0002129847 scopus 로고
    • A distributed BIST control scheme for complex VLSI devices
    • Y. Zorian. A distributed BIST control scheme for complex VLSI devices. In Proc. 11th IEEE VLSI Test Symposium. pages 4-9. 1993.
    • (1993) Proc. 11th IEEE VLSI Test Symposium , pp. 4-9
    • Zorian, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.