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Volumn , Issue , 2001, Pages 131-139
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CTL the language for describing core-based test
a b a c d e
c
IBM
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER HARDWARE;
CONSTRAINT THEORY;
INTEGRATED CIRCUIT TESTING;
MICROPROCESSOR CHIPS;
CORE TEST LANGUAGE (CTL);
CHIP SCALE PACKAGES;
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EID: 0035680667
PISSN: 10893539
EISSN: None
Source Type: Journal
DOI: 10.1109/TEST.2001.966626 Document Type: Article |
Times cited : (30)
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References (12)
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