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IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 131-139

CTL the language for describing core-based test

(6) Kapur, Rohit a Lousberg, Maurice b Taylor, Tony a Keller, Brion c Reuter, Paul d Kay, Douglas e

a SYNOPSYS INC (United States)

b PHILIPS RESEARCH LABORATORIES (Germany)

c IBM (United States)

d MENTOR GRAPHICS CORPORATION (United States)

e CISCO SYSTEMS (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; CONSTRAINT THEORY; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS;

CORE TEST LANGUAGE (CTL);

CHIP SCALE PACKAGES;

EID: 0035680667 PISSN: 10893539 EISSN: None Source Type: Journal
DOI: 10.1109/TEST.2001.966626 Document Type: Article

Times cited : (30)

References (12)

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- Kluwer Academic Publishers, Norwell, Massachusetts
- Reuse Methodology Manual for System-on-a-Chip Designs
- Keating, M.¹ Bricaud, P.²

2
- 85008997267
- CTL Web Site

3
- 84893743954
- IEEE P1500 Web Site

4
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- Towards a standard for embedded core test: An example
- (1999) Proceedings IEEE International Test Conference (ITC) , pp. 616-627
- Marinissen, E.J.¹ Zorian, Y.² Kapur, R.³ Taylor, T.⁴ Whetsel, L.⁵

5
- 84893716044
- VSI Alliance Web Site

6
- 0007834975
- Macro test: A liberal test approach for embedded reusable cores
- (1997) Digest of Papers of IEEE International Workshop on Testing Embedded Core Based Systems (TECS) , pp. 12-19
- Marinissen, E.J.¹ Lousberg, M.²

7
- 0034480246
- On using IEEE P1500 SECT for test plug-n-play
- (2000) Proceedings of the International Test Conference (ITC) , pp. 770-777
- Marinissen, E.J.¹ Kapur, R.² Zorian, Y.³

8
- 0032320505
- A structured and scalable mechanism for test access to embedded reusable cores
- (1998) Proceedings IEEE International Test Conference (ITC) , pp. 284-293
- Marinissen, E.J.¹ Arendsen, R.² Bos, G.³ Dingemanse, H.⁴ Lousberg, M.⁵ Wouters, C.⁶

9
- 0007739749
- IEEE New York
- (1990) IEEE Standard Test Access Port and Boundary-Scan Architecture IEEE Standard 1149.1-1990

10
- 0007786508
- IEEE New York, March
- (1995) Supplement to IEEE Std 1149.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE Std 1149.1b-1994

11
- 0006685350
- IEEE New York, September
- (1999) IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data - Language Manual - IEEE Std. 1450.0-1999

12
- 85013897619
- The role of test protocols in testing embedded-core-based system IC's
- May
- (1999) Proceedings of the IEEE European Test Workshop (ETW) , pp. 70-75
- Marinissen, E.J.¹ Lousberg, M.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.