Structured and scalable mechanism for test access to embedded reusable cores

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 284-293

  Marinissen, Erik Jan ^a   Arendsen, Robert ^a   Bos, Gerard ^a   Dingemanse, Hans ^a   Lousberg, Maurice ^a   Wouters, Clemens ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

TEST CONTROL MECHANISM (TCM);

INTEGRATED CIRCUIT TESTING; STANDARDIZATION;

INTEGRATED CIRCUIT LAYOUT;

EID: 0032320505     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743166     Document Type: Conference Paper

References (15)