Conversion of small functional test sets of nonscan blocks to scan patterns

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 691-700

  Ross, Don E ^a   Wood, Tim ^b   Giles, Grady ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MEMORY ARRAYS; NONSCAN BLOCKS; SCAN PATTERNS; SEARCH SPACE EXPLOSION; SMALL FUNCTIONAL TEST SETS;

ALGORITHMS; COMPUTER HARDWARE; DATA STORAGE EQUIPMENT; EMBEDDED SYSTEMS; FAILURE ANALYSIS; FOURIER TRANSFORMS; INTEGRATED CIRCUIT TESTING; PROBLEM SOLVING;

BUILT-IN SELF TEST;

EID: 0034484422     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2000.894264     Document Type: Article

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