Macro Testability; The Results of Production Device Applications

Proceedings - International Test Conference

Volumn 1992-January, Issue , 1992, Pages 232-241

  Bouwman, F ^a   Oostdijk, S ^a   Stans, R ^a   Bennetts, B ^a,b   Beenker, F ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b Bennetts Asso ^*  (United Kingdom)

Author keywords

Application software; Assembly; Integrated circuit testing; Laboratories; Logic design; Logic devices; Production; Software testing; Software tools; Very large scale integration

Indexed keywords

EID: 84961244832     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1992.527824     Document Type: Conference Paper

References (0)