Testing embedded-core based system chips

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 130-143

  Zorian, Yervant ^a   Marinissen, Erik Jan ^a   Dey, Sujit ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED SYSTEMS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS;

EMBEDDED CORE;

INTEGRATED CIRCUIT TESTING;

EID: 0032306079     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (36)