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Volumn , Issue , 2000, Pages 770-777

On using IEEE P1500 SECT for test plug-n-play

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BUILT-IN SELF TEST; COMPUTER HARDWARE DESCRIPTION LANGUAGES; DESIGN FOR TESTABILITY; INTEGRATED CIRCUIT MANUFACTURE; INTEROPERABILITY; MICROPROCESSOR CHIPS; STANDARDIZATION;

EID: 0034480246     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (67)

References (23)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.