On using IEEE P1500 SECT for test plug-n-play

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 770-777

  Marinissen, Erik Jan ^a   Kapur, Rohit ^a   Zorian, Yervant ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BUILT-IN SELF TEST; COMPUTER HARDWARE DESCRIPTION LANGUAGES; DESIGN FOR TESTABILITY; INTEGRATED CIRCUIT MANUFACTURE; INTEROPERABILITY; MICROPROCESSOR CHIPS; STANDARDIZATION;

CORE TEST LANGUAGE; CORE WRAPPER; SYSTEM ON CHIP; TEST PLUG-N-PLAY;

INTEGRATED CIRCUIT TESTING;

EID: 0034480246     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)