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Volumn , Issue , 2000, Pages 770-777
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On using IEEE P1500 SECT for test plug-n-play
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATIC TESTING;
BUILT-IN SELF TEST;
COMPUTER HARDWARE DESCRIPTION LANGUAGES;
DESIGN FOR TESTABILITY;
INTEGRATED CIRCUIT MANUFACTURE;
INTEROPERABILITY;
MICROPROCESSOR CHIPS;
STANDARDIZATION;
CORE TEST LANGUAGE;
CORE WRAPPER;
SYSTEM ON CHIP;
TEST PLUG-N-PLAY;
INTEGRATED CIRCUIT TESTING;
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EID: 0034480246
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (67)
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References (23)
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