System chip test: how will it impact your design?

Proceedings - Design Automation Conference

Volumn , Issue , 2000, Pages 136-141

  Zorian, Yervant ^a   Marinissen, Erik Jan ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; DESIGN FOR TESTABILITY; EMBEDDED SYSTEMS; INTEGRATED CIRCUIT LAYOUT; STANDARDS;

EMBEDDED CORES; HARDWARE DESCRIPTION LEVELS; SYSTEM ON CHIP;

INTEGRATED CIRCUIT TESTING;

EID: 0033681621     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)