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Volumn 17, Issue 1, 2001, Pages 228-233

Proximity X-ray lithography using self-assembled alkylsiloxane films: Resolution and pattern transfer

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; DEPOSITION; MASKS; METALLIC FILMS; NICKEL; REACTIVE ION ETCHING; SILICA; SILICON; SILICONES; X RAY LITHOGRAPHY;

EID: 0035121326     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la001176h     Document Type: Article
Times cited : (68)

References (46)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.