A genetic algorithm framework for test generation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 16, Issue 9, 1997, Pages 1034-1044

  Rudnick, Elizabeth M ^a   Patel, Janak H ^a   Greenstein, Gary S ^a   Niermann, Thomas M ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Automatic test generation; Genetic algorithms; Sequential circuit testing

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; GENETIC ALGORITHMS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; OPTIMIZATION; PROBLEM SOLVING;

AUTOMATIC TEST GENERATION; FAULT ORIENTED ALGORITHMS;

SEQUENTIAL CIRCUITS;

EID: 0031222418     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.658571     Document Type: Article

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