Application of simple genetic algorithms to sequential circuit test generation

Proceedings of the European Design and Test Conference

Volumn , Issue , 1994, Pages 40-45

  Rudnick, Elizabeth M ^a   Holm, John G ^a   Saab, Daniel G ^a   Patel, Janak H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; ELECTRIC FAULT LOCATION; ELECTRIC NETWORK ANALYSIS; ERROR ANALYSIS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; SEQUENTIAL CIRCUITS;

CONTEST TEST GENERATOR; DETERMINISTIC ALGORITHMS; GENETIC ALGORITHMS; SEQUENTIAL CIRCUIT TEST GENERATION; SOFTG SEQUENTIAL CIRCUIT TEST GENERATOR;

ALGORITHMS;

EID: 0028098538     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)