COMPACTEST: A method to generate compact test sets for combinational circuits

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 194-203

  Pomeranz, Irith ^a   Reddy, Lakshmi N ^a   Reddy, Sudhakar M ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; CONTROL SYSTEMS; HEURISTIC PROGRAMMING;

BENCHMARK CIRCUITS; COMPACTEST;

COMBINATORIAL CIRCUITS;

EID: 0026618720     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (27)