Multiple Distributions for Biased Random Test Patterns

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 9, Issue 6, 1990, Pages 584-593

  Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

biased random patterns; low cost test; multiple weights; Random tests

Indexed keywords

LOGIC CIRCUITS, COMBINATORIAL--COMPUTER AIDED DESIGN; PROBABILITY--RANDOM PROCESSES;

RANDOM TEST PATTERNS;

INTEGRATED CIRCUITS, DIGITAL;

EID: 0025442153     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.55187     Document Type: Article

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