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Volumn , Issue , 1989, Pages 28-37
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ESSENTIAL: An efficient self-learning test pattern generation algorithm for sequential circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTIFICIAL INTELLIGENCE;
COMPUTER PROGRAMMING--ALGORITHMS;
INTELLIGENT HEURISTICS;
RECONVERGENT FANOUT;
SENSITIZATION;
SEQUENTIAL CIRCUITS;
TEST PATTERN GENERATION;
LOGIC CIRCUITS, SEQUENTIAL;
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EID: 0024891271
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (30)
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References (23)
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