ESSENTIAL: An efficient self-learning test pattern generation algorithm for sequential circuits

Volumn , Issue , 1989, Pages 28-37

  Schulz, Michael H ^a   Auth, Elisabeth ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTER PROGRAMMING--ALGORITHMS;

INTELLIGENT HEURISTICS; RECONVERGENT FANOUT; SENSITIZATION; SEQUENTIAL CIRCUITS; TEST PATTERN GENERATION;

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0024891271     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)