Iterative [simulation-based genetics + deterministic techniques] = complete ATPG

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn , Issue , 1994, Pages 40-43

  Saab, Daniel G ^a   Saab, Youssef G ^a   Abraham, Jacob A ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; ELECTRIC FAULT LOCATION; ELECTRIC NETWORK ANALYSIS; EQUIVALENT CIRCUITS; GENETIC ALGORITHMS; ITERATIVE METHODS; RANDOM PROCESSES; STATE ESTIMATION; VECTORS;

AUTOMATIC TEST PATTERN GENERATION; FAULT CLUSTER; SIMULATION BASED TECHNIQUES; TEST VECTOR GENERATOR;

INTEGRATED CIRCUIT TESTING;

EID: 0028706754     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (28)