Alternating strategies for sequential circuit ATPG

Proceedings of the 1996 European Conference on Design and Test, EDTC 1996

Volumn , Issue , 1996, Pages 368-374

  Hsiao, Michael S ^a   Rudnick, Elizabeth M ^a   Patel, Janak H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GENETIC ALGORITHMS; SEQUENTIAL CIRCUITS; TIMING CIRCUITS;

BENCHMARK CIRCUIT; DETERMINISTIC ALGORITHMS; FAULT COVERAGES; REDUNDANCY IDENTIFICATIONS; SECOND PHASE; TEST GENERATIONS; TEST SEQUENCE GENERATIONS; TEST SETS;

TESTING;

EID: 85030111960     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDTC.1996.494327     Document Type: Conference Paper

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