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Volumn , Issue , 1995, Pages 183-188
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Combining deterministic and genetic approaches for sequential circuit test generation
a
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Author keywords
[No Author keywords available]
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Indexed keywords
COMBINATORIAL CIRCUITS;
COMPUTER SIMULATION;
ELECTRIC EXCITATION;
ELECTRIC FAULT CURRENTS;
ELECTRIC NETWORK SYNTHESIS;
GENETIC ALGORITHMS;
BENCHMARK CIRCUITS;
FAULT EXCITATION;
HYBRID SEQUENTIAL CIRCUIT TEST GENERATOR;
STATE JUSTIFICATION;
UNTESTABLE FAULTS;
SEQUENTIAL CIRCUITS;
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EID: 0029223036
PISSN: 0738100X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/217474.217527 Document Type: Conference Paper |
Times cited : (38)
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References (23)
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