Combining deterministic and genetic approaches for sequential circuit test generation

Proceedings - Design Automation Conference

Volumn , Issue , 1995, Pages 183-188

  Rudnick, Elizabeth M ^a   Patel, Janak H ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; ELECTRIC EXCITATION; ELECTRIC FAULT CURRENTS; ELECTRIC NETWORK SYNTHESIS; GENETIC ALGORITHMS;

BENCHMARK CIRCUITS; FAULT EXCITATION; HYBRID SEQUENTIAL CIRCUIT TEST GENERATOR; STATE JUSTIFICATION; UNTESTABLE FAULTS;

SEQUENTIAL CIRCUITS;

EID: 0029223036     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/217474.217527     Document Type: Conference Paper

References (23)