Singlemode chalcogenide fiber infrared SNOM probes

Ultramicroscopy

Volumn 77, Issue 1-2, 1999, Pages 77-81

  Schaafsma, D T ^a   Mossadegh, R ^a   Sanghera, J S ^a   Aggarwal, I D ^a   Gilligan, J M ^b   Tolk, N H ^b   Luce, M ^c   Generosi, R ^c   Perfetti, P ^c   Cricenti, A ^c   Margaritondo, G ^d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c CNR   (Italy)

^d EPFL   (Switzerland)

Author keywords

FEL; IR SNOM; Singlemode chalcogenide fiber; Spatial resolution

Indexed keywords

FREE ELECTRON LASERS; INFRARED IMAGING; MELTING; PROBES; SURFACE TOPOGRAPHY; TENSILE STRENGTH;

INFRARED MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM); SINGLE MODE CHALCOGENIDE FIBERS; SPATIAL RESOLUTION;

OPTICAL MICROSCOPY;

ARTICLE; FIBER; MELTING POINT; OPTICAL RESOLUTION; SCANNING ELECTRON MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; TENSILE STRENGTH;

EID: 0032960054     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00004-2     Document Type: Article

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