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Volumn 129, Issue 5-6, 1996, Pages 414-422
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Imaging and local infrared spectroscopy with a near field optical microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC FIELDS;
FREE ELECTRON LASERS;
IMAGE ANALYSIS;
INFRARED SPECTROSCOPY;
LIGHT SOURCES;
SCANNING TUNNELING MICROSCOPY;
SILICA;
SILICON WAFERS;
CASCADE ARC;
NEAR FIELD OPTICAL MICROSCOPE;
PHOTON SCANNING TUNNELING MICROSCOPE;
OPTICAL MICROSCOPY;
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EID: 0030242499
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/0030-4018(96)00174-5 Document Type: Article |
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Times cited : (41)
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References (23)
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