The merits and limitations of local impact lonization theory

IEEE Transactions on Electron Devices

Volumn 47, Issue 5, 2000, Pages 1080-1088

  Plimmer, Stephen A ^a   David, John P R ^a   Ong, D S ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Avalanche diodes; Avalanche photodiodes; Hot carriers; Impact ionization; Monte carlo methods; Power semiconductor devices

Indexed keywords

EID: 0000186629     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.841244     Document Type: Article

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