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Volumn 16, Issue 17, 1983, Pages 3373-3388
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Lucky-drift mechanism for impact ionisation in semiconductors
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0042755866
PISSN: 00223719
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3719/16/17/020 Document Type: Article |
Times cited : (179)
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References (18)
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