Lucky Drift Estimation of Excess Noise Factor for Conventional Avalanche Photodiodes Including the Dead Space Effect

IEEE Transactions on Electron Devices

Volumn 39, Issue 5, 1992, Pages 1129-1135

  Marsland, John S ^a   Woods, R C ^b   Brownhill, C A ^b  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL COMMUNICATION EQUIPMENT; OPTOELECTRONIC DEVICES; SEMICONDUCTOR DIODES, AVALANCHE - NOISE;

AVALANCHE PHOTODIODES; OPTOELECTRONICS; SIGNAL NOISE;

SEMICONDUCTOR DIODES, PHOTODIODE;

EID: 0026866665     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.129093     Document Type: Article

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